This study delves into the reliability of Dual-Active Bridges (DABs), specifically focusing on open circuit faults (OCF). The paper introduces a rapid OCF detection method for DABs under parasitic coupling conditions, utilizing the drain-source voltage (VDS) of MOSFET. OCF-induced parasitic coupling in the primary voltage (Vpri) leads to an increased output voltage with oscillations. The proposed fault detection method entails measuring VDS's oscillatory behavior through signal conditioning steps, validated through simulations and experiments, demonstrating effectiveness in detecting faults within 20 µs. The paper also explores parameters influencing oscillation frequency during a fault. In conclusion, the suggested method offers a succinct and efficient approach for swift OCF detection in DABs under parasitic coupling conditions, with potential applications across various DAB topologies. The study suggests possible extensions and underscores the method's compatibility with other fault detection approaches, providing valuable insights for practical implementations in DAB systems.
