President
STAr-Edge Technologies
Dan Hicks, President, STAr-Edge Technologies, United States
Dan Hicks is President of STAr-Edge Technologies, the US subsidiary of STAr-Technologies of Taiwan. STAr is a leader in products for all aspects of test, reliability and probe in the semiconductor manufacturing chain. Dan is an engineer with 25 years’ experience in precision instrumentation and automated test equipment (ATE). He has designed methods and instruments to measure all ranges of currents from the sub-femto-ampere to the kilo-ampere and everything in between. Dan holds an MSEE from the University of San Diego California.
IS15.4 - High slew rate (10 A/ns) current measurement with low-inductance PCB embedded sensor
Wednesday, February 28, 2024
2:45 PM – 3:10 PM PST