Vice President of Reliability and Qualification
VisIC Technologies
Kurt has 23 years of experience in Gallium Nitride Reliability. He has worked on RF GaN devices at Raytheon, supporting reliability analysis of high power RF amplifiers for radar and other high frequency applications. More recently, Kurt was the Reliability Manager at Transphorm, working on high voltage GaN power devices. He was responsible for reliability testing, analysis and degradation models to support both physical understanding of factors contributing to the reliability of devices and customer requests for specialized testing and understanding. He contributed to the successful JEDEC and automotive qualification of Transphorm’s GaN products. He joined VisIC in July 2022 as the VP of Reliability and Qualification. He is tasked with continuing the work to understand the reliability of GaN power devices and oversee the qualification and reliability of VisIC devices He is the Chair of the JEDEC 70.1 Wide Bandgap Power Electronic Conversion Semiconductors. He is also a contributing member to the ECPE AQG-324 Task Group on GaN Power Modules. Kurt received his PhD in Electrical Engineering from UC San Diego in 2000. He is currently a member of the leadership team for the JEDEC JC70 efforts to develop standards for GaN and SiC testing, datasheets and reliabilit
IS22.4 - Reliability of Large Scale GaN Devices for Invertor Applications
Thursday, February 29, 2024
9:45 AM – 10:10 AM PST