IS22 - Reliability of WBG Power Devices

Thursday, February 29, 2024

8:30 AM – 11:20 AM PST

Location: 201A

Industry Session Chair(s)

8:30 AM – 8:55 AM PST

Update on Long Term Stability of SiC Power Transistors
Industry Session Presenter: Peter Friedrichs, PhD (he/him/his) – Infineon Technologies AG
8:55 AM – 9:20 AM PST

Beyond the Datasheet - WBG Test and Validation
Industry Session Presenter: Adam Anders, MSEE – Wolfspeed
9:20 AM – 9:45 AM PST

Shaping the Future of Quality and Reliability for WBG Power Devices: JEDEC JC-70 and IEC Recent Developments
Industry Session Presenter: Jaume Roig Guitart, PhD – onsemi
Industry Session Presenter: Stephanie Watts Butler, PhD, PE (she/her/hers) – WattsButler LLC
9:45 AM – 10:10 AM PST

Reliability of Large Scale GaN Devices for Invertor Applications
Industry Session Presenter: Kurt V. Smith, PhD – VisIC Technologies
10:30 AM – 10:55 AM PST

Using Test-to-Fail Methodology to Accurately Project Lifetime of GaN HEMTs in Common DC-DC Converter Topologies
Industry Session Presenter: Shengke Zhang, PhD – Efficient Power Conversion
10:55 AM – 11:20 AM PST

15-mΩ GaN Device with 5-μs Short-Circuit Withstand Time
Industry Session Presenter: Davide Bisi, PhD (he/him/his) – Transphorm