IS15 - How Test Catches Up with WBG Power Devices?

Industry Session Chair(s)

• 

  Jaume Roig Guitart, PhD

  Member of the Technical Staff
  onsemi
• 

  Stephanie Butler, PhD, PE (she/her/hers)

  Technology Innovation Architect
  WattsButler LLC

Presentations:

• 1:30 PM – 1:55 PM PST

  An overview of software based dynamic RdsON measurement during double pulse test for wide bandgap devices
  

  Industry Session Presenter: Srikrishna NH – Tektronix

  Industry Session Presenter: Vivek Shivaram (he/him/his) – Tektronix
• 1:55 PM – 2:20 PM PST

  Why are high definition oscilloscopes and probes important for WBG device measurement accuracy?
  

  Industry Session Presenter: William Kaunds – Teledyne LeCroy

  Industry Session Presenter: Jonathan Shechter – Teledyne LeCroy
• 2:20 PM – 2:45 PM PST

  Challenges in dynamic reliability testing of WBG Power Semiconductors – and how to overcome them
  

  Industry Session Presenter: Frank Heidemann, Dipl-Ing (he/him/his) – NI
• 2:45 PM – 3:10 PM PST

  High slew rate (10 A/ns) current measurement with low-inductance PCB embedded sensor
  

  Industry Session Presenter: Dan Hicks, MSEE – STAr-Edge Technologies
• 3:40 PM – 4:05 PM PST

  Characterizing In Circuit Switch Device Performance
  

  Industry Session Presenter: Ken Henderson, ME – Cleverscope

  Industry Session Presenter: Bart Schroder – Cleverscope
• 4:05 PM – 4:30 PM PST

  Essential distinctions in DC characterization of SiC MOSFETs including its effects on ruggedness and reliability
  

  Industry Session Presenter: Sara Kuzmanoska, Master of Eng., Automotive Electronics (she/her/hers) – onsemi

  Industry Session Presenter: Philipp Rehlaender – onsemi

  Industry Session Presenter: Lukas Richert – onsemi
• 4:30 PM – 4:55 PM PST

  Understanding Bandwidth Requirements When Measuring Switching Characteristics
  

  Industry Session Presenter: Michael Zimmermann – Keysight Technologies

  Industry Session Presenter: Tom Neville – Keysight