EX - Challenges and Solutions for the Precise Dynamic & Static Characterization and Reliability Test of Silicon Carbide Power Semiconductor Device

The dynamic & static characteristics and challenges for silicon carbide power semiconductor devices will be introduced firstly. Key technologies for the precise dynamic and static characterization of silicon carbide power semiconductor devices will be discussed in details. Then key technologies for reliability test of silicon carbide power semiconductor devices will be introduced. Finally, total solutions for the precise dynamic & static characterization and reliability test will be given.