Double-pulse testing is an ideal way to analyze and characterize the performance and behavior of semiconductor switches, in principle. In practice, it can be very difficult to achieve meaningful results when testing very fast switches. In addition to the normal challenges of designing a high-speed circuit, the double pulse test adds its own problems in the form of perturbations due to sensor insertion. In this talk we present tips and tools for successful double-pulse measurement of the latest high-speed Si, GaN, and SiC switches.
