Precise voltage and current sampling are required for better waveform quality. However, interferences caused by switching noise pose challenges to acquiring precise averaging current value. This digest presents some considerations regarding precise current sampling for high-frequency converters. Current spikes caused by spurious sampling points are analyzed in detail. A dynamic sampling method in every switching cycle is proposed to avoid the high-frequency oscillation caused by switching transitions. The proposed method is validated in the platform of three-phase/level SiC-based T-type converter.
