IS29 - Application Specific Measurements

Industry Session Chair(s)

• BO

  Bridget O'Gorman

  PESC Inc
• DR

  Diego Raffo

  Infineon Technologies

Presentations:

• 1:30 PM – 1:55 PM PST

  Insulation Specifications and Testing of Isolated Gate Drivers: A Comprehensive Overview
  

  Industry Session Presenter: Thomas LaBella, PhD (he/him/his) – Texas Instruments
• 1:30 PM – 1:55 PM PST

  Challenges in High Voltage Burn-in Test of Power MOSFETs
  

  Industry Session Presenter: Vernon Rogers – Aehr Test Systems
• 1:55 PM – 2:20 PM PST

  The Real-Time Solution to Test and Debug Solar Grid-Tied Inverter Designs with Grid Feed Capability Used in Efficient Renewable Energy Applications
  

  Industry Session Presenter: Vivek Shivaram (he/him/his) – Tektronix
• 2:20 PM – 2:45 PM PST

  Standardizing Gate Driver UVLO Across the Industry - Thresholds and Accuracy
  

  Industry Session Presenter: Aiyappa Byrajanda Naniappa – Texas Instruments