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Technical Lecture

T20 - SiC Devices

Wednesday, February 28, 2024
1:30 PM – 5:00 PM PST
Location: 104A

Presentations:

  • 1:30 PM – 1:50 PM PST
    Deep Investigation on SiC MOSFET Degradation Under Gate Switching Stress and Application Switching Stress

    Technical Lecture Presenter: Alexis A. Gómez, MSc – University of Oviedo

  • 1:50 PM – 2:10 PM PST
    Current Balancing of Parallel High Current SiC Half Bridge Modules Using Delay Based Active Gate Driving with Inter-Device Inductances

    Technical Lecture Presenter: Mason Parker, MEng (he/him/his) – University Of Edinburgh

  • 2:10 PM – 2:30 PM PST
    Surge Current Handling Capability of SiC Fets

    Technical Lecture Presenter: Larry Xueqing Li, PhD – Qorvo, Inc.

  • 2:30 PM – 2:50 PM PST
    Design of 10 kV SiC MOSFET Power Module Based MW-Level Modular Multilevel Converter Phase-Leg

    Technical Lecture Presenter: Ruirui Chen, PhD – University of Tennessee

  • 2:50 PM – 3:10 PM PST
    Electro-Thermal Trade-Off for AC-Current Injection & Series-Clamping-Diodes Based Rds-On Estimation Circuit

    Technical Lecture Presenter: Furkan Karakaya, PhD Student (he/him/his) – University of Illinois Urbana-Champaign

  • 3:40 PM – 4:00 PM PST
    Gate-Source-Dependent Soft- and Hard-Switching Losses of 1200V SiC MOSFETs Utilizing Heatsinkless Calorimetric Measurements Based on Optical Sensors

    Technical Lecture Presenter: Ruben Schnitzler, MA – University of Stuttgart

  • 4:00 PM – 4:20 PM PST
    Online Monitoring Method for SiC MOSFET Gate Oxide Degradation Based on Gate Voltage Filtering

    Technical Lecture Presenter: Jiahong Liu, PhD – Aalborg University

  • 4:20 PM – 4:40 PM PST
    Energy-Based Method to Estimate the Partial Hard Turn-on Loss of Complementary SiC MOSFET from Experiment

    Technical Lecture Presenter: Kaushik Basu, PhD – Indian Institute of Sciences

  • 4:40 PM – 5:00 PM PST
    Measurement of Circuit Parasitics of a 200kW SiC Based Stack

    Technical Lecture Presenter: Kaushik Basu, PhD – Indian Institute of Sciences